Simulation Methods for Ionizing Radiation Single Event Effects Evaluation

摘要

Single Event Effects (SEE) produced by highly energetic particle hits on sensitive circuit regions constitutes a main topic in reliability and device performance in space applications. Due to their high cost and limited availability, alternative methods to particle accelerator tests have been developed. In this sense, numerical simulations represent an excellent tool to predict device and circuit behaviour induced by particle hits. This paper deals with simulation techniques and their use in SEE study. Some different methods are shown and their possibilities to determine SEEs and their consequences on circuit behaviour are evaluated.