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A Method to Reduce Influence of Gain Errors and Offsets of Internal Components on Performance of Adaptive Sub-ranging ADCs

机译:一种减少内部组件偏移对自适应子测距ADC性能影响的方法

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The paper proposes a method of designing and calibrating of an adaptive sub-ranging ADC that is robust to both gain errors and offsets of the components of its analog part, which may simplify and reduce the costs of manufacturing of adaptive ADCs. For facilitation of postproduction calibration, we propose a method of measurement of the actual gain and offset of particular analog tracts used in subsequent stages of conversion, that utilizes the sub-ADC already present in the analog part of the adaptive ADC. Efficiency of the proposed approach is discussed and evaluated on the basis of the results of simulation experiments.
机译:本文提出了一种设计和校准自适应子测距ADC的方法,其对其模拟部分的组件的增益误差和偏移具有鲁棒,这可以简化和降低适应性ADC的制造成本。为了便于校准后,我们​​提出了一种测量用于随后转换阶段的特定模拟束的实际增益和偏移的方法,其利用了自适应ADC的模拟部分中存在的子ADC。基于模拟实验的结果讨论和评估所提出的方法的效率。

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