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Probing optical lattice states with double well atom interferometry

机译:具有双孔原子干涉测量的探测光学晶格状态

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Interference patterns produced by binomially splitting atom states in a double well optical lattice can be used to probe many important properties of this system, including double well tilt (and tilt inhomogeneities), the on-site interaction energy U, atom number distribution across the lattice, vibrational excitation, and lattice state coherence, making atom interferometry a powerful tool to analyze and characterize the structure and states of optical lattice systems, an essential task if they are to realize their potential for quantum information and for a variety of other proposed uses.
机译:由双孔光学晶格中的短型分裂原子状态产生的干涉图案可用于探测该系统的许多重要特性,包括双孔倾斜(和倾斜不均匀性),现场交互能量U,晶格上的原子编号分布,振动激发和晶格状态相干性,使原子干涉测量是一种强大的工具来分析和表征光学晶格系统的结构和状态,如果他们用于实现它们对量子信息的潜力和各种其他建议的用途的基本任务。

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