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Accretion process powering the supersoft X-ray sources: A test with the multiwavelength modeling the SED

机译:ACCRETION工艺为Supersoft X射线源供电:用多波长造型测试的测试

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Radiation of supersoft X-ray sources (SSS) dominates both the supersof X-ray and the far-UV domain, and can be detected also within the optical/near-IR wavelengths. To determine fundamental parameters of SSSs, a multiwavelength approach in modeling their spectra is essential. By this way, the basic physical parameters of a SSS (the temperature, radius, luminosity and column density of the neutral hydrogen) can be determined unambiguously. Here I demonstrate this case for the symbiotic X-ray binary RXJ0059.1-7505 (LIN 358) in the Small Magellanic Cloud (SMC).
机译:Supersoft X射线源(SSS)的辐射占主导地位X射线和远UV结构域,也可以在光/近红外波长内检测。为了确定SSSS的基本参数,模拟其光谱的多波长方法是必不可少的。通过这种方式,可以明确地确定SSS的基本物理参数(中性氢气的温度,半径,亮度和列密度)。在这里,我在小麦哲伦云(SMC)中展示了共生X射线二进制RXJ0059.1-7505(LIN 358)的这种情况。

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