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Study of ferroelectric SBN thin films for electro-optic applications

机译:电光应用铁电SBN薄膜的研究

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The Ferroelectric strontium barium niobate (SBN) thin films are prepared using Pulsed Laser Deposition (PLD) technique. XRD spectra of the prepared films indicate the polycrystalline growth confirming the formation of tetragonal tungsten bronze structure. A waveguide is fabricated so as to guide the light in SBN thin film. The EO measurements for the SBN thin films have been carried out using Senarmont Compensation method in order to examine the dynamic variation of EO coefficient of the prepared films. The value of dynamic EO coefficient is found to be 198pm/V.
机译:使用脉冲激光沉积(PLD)技术制备铁电锶钡铌酸钡(SBN)薄膜。制备薄膜的XRD光谱表明了多晶生长,证明了四边形钨青铜结构的形成。制造波导以引导SBN薄膜中的光。使用SenArmont补偿方法进行了SBN薄膜的EO测量,以检查制备膜的EO系数的动态变化。动态EO系数的值被发现为198pm / v。

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