Electron-Backscattered Diffraction (EBSD) as a domain analysis technique in BiFeO{sub}3-PbTiO{sub}3

摘要

xBiFeO{sub}3 -^s(1-x)PbTiO{sub}3 (BFPT) single crystals have been grown via a flux method for a range of compositions. Presented here is a study of the domain configuration in these materials using electron backscattered diffraction (EBSD), which is an SEM based technique providing information on crystallography and orientation at the microscale; to the authors' knowledge this is the first time this technique has been applied in this manner. A full domain map has been generated for several compositions, displaying a mixture of rhombohedral and tetragonal phases. The material shows a hierarchy of domains from those visible with an optical microscope to those only visible in the TEM, and EBSD has provided a means by which to probe the larger domain structures. A Rietveld analysis of the crushed single crystal X-ray diffraction data shows a good correlation with the EBSD with respect to the quantity of each of the phases present.