首页> 外文会议>European Photovoltaic Solar Energy Conference >COMPARISON OF FILL FACTOR LOSS MECHANISMS FROM PRINT QUALITY AND ELECTRICAL PARAMETERS IN THE MOVE TOWARDS HIGHER SHEET RESISTANCE EMITTERS
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COMPARISON OF FILL FACTOR LOSS MECHANISMS FROM PRINT QUALITY AND ELECTRICAL PARAMETERS IN THE MOVE TOWARDS HIGHER SHEET RESISTANCE EMITTERS

机译:填充因子损耗机制从朝向高薄层电阻发射器中的印刷质量和电气参数的比较

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As a supplier of contact metallization pastes for crystalline silicon solar cells, Heraeus works with cell manufacturers to improve fill factors and mitigate losses associated to lower emitter dopant levels. Here we use a computer model to segregate the influences from multiple variables on fill factor and shading related losses. The goal is that by separating the influence of these factors we can better understand each of them individually. The model confirms that front contact pastes capable of delivering lower contact resistance, higher aspect ratios, and better printed cross sections (or paste slump) will be critical to driving towards higher fill factors and efficiencies.
机译:作为结晶硅太阳能电池的接触金属化浆料的供应商,Heraeus与细胞制造商合作,以改善与降低发射极掺杂剂水平相关的填充因子和减轻损失。在这里,我们使用计算机模型来分离来自多个变量的影响因子和隐形相关损失。目标是通过分离这些因素的影响,我们可以更好地单独理解它们中的每一个。该模型确认,能够提供较低接触电阻,更高纵横比和更好的印刷横截面(或粘贴坍落度)的前接触浆料对推动更高的填充因子和效率来说是至关重要的。

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