首页> 外文会议>European Photovoltaic Solar Energy Conference >OPTIMIZATION OF HYDROGENATED AMORPHOUS SILICON (A-SI: H) THIN FILMS DEPOSITED BY RF MAGNETRON SPUTTERING FOR A-SI/C-SI PHOTOVOLTAIC APPLICATIONS
【24h】

OPTIMIZATION OF HYDROGENATED AMORPHOUS SILICON (A-SI: H) THIN FILMS DEPOSITED BY RF MAGNETRON SPUTTERING FOR A-SI/C-SI PHOTOVOLTAIC APPLICATIONS

机译:RF磁控溅射沉积的氢化非晶硅(A-Si:H)薄膜的优化,用于A-Si / C-Si光伏应用

获取原文

摘要

In this work, hydrogenated amorphous silicon (α-Si: H) deposited by RF magnetron sputtering with argon and hydrogen gas mixture plasma has been characterized. We focused on the effects of deposition parameters, such as discharge power, substrate temperature and hydrogen flow rate on the properties of the fabricated α-Si:H films. Various diagnostics techniques such as Raman spectroscopy, optical transmission measurements, Fourier Transform Infrared (FTIR) spectroscopy were employed to determine optimum deposition conditions for a-Si:H films with sufficient quality for photovoltaic applications.
机译:在这项工作中,已经表征了RF磁控溅射沉积的氢化非晶硅(α-Si:H),具有氩气和氢气混合物等离子体。我们专注于沉积参数的影响,例如放电功率,衬底温度和氢气流速对制造的α-Si:H薄膜的性质。采用各种诊断技术,如拉曼光谱,光学传输测量,傅里叶变换红外(FTIR)光谱,以确定A-Si:H膜的最佳沉积条件,具有足够的光伏应用质量。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号