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A CHEMISTS VIEW OF PRECURSORS AND PROCESSES FOR THE PRODUCTION OF HAFNIUM-BASED HIGH-K DIELECTRICS

机译:生产铪基高k电介质生产前体和工艺的化学家介绍

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The four major Hf precursors used by the industry are reviewed, compared and contrasted. The production of Hf-based chemicals proceeds through HfCl_4, the first of the four major Hf precursors used by the industry, and the precursor to all Hf based materials. The synthesis of the other three major Hf precursors (TEMAH, TDEAH and Hf t-butoxide) starting from HfCl_4 provides a rational model for the major impurities commonly found in these materials. Analysis of these impurities in Hfbased precursors is reviewed, including the influence that differing sample preparation methods can have on analytical results leading to apparently different analyses of the same chemical batch. Thermal stability of the Hf precursors is also reviewed. Using our knowledge of the chemical reactivity of these precursors with protic reagents we were able to design a CVD method for producing HfSiON films.
机译:该行业使用的四个主要HF前体进行审查,比较和对比。通过HFCL_4,生产HF的化学物质的生产,该行业使用的四个主要HF前体中的第一个,以及所有HF基材料的前兆。从HFCL_4开始的其他三个主要HF前体(Temah,TdeAh和Hf T-丁基)的合成为这些材料中常见的主要杂质提供了合理的模型。综述了对HFBASED前体中这些杂质的分析,包括不同样品制备方法可以对分析结果具有的影响,从而显然不同的相同化学批次分析。还介绍了HF前体的热稳定性。利用我们具有质粒试剂的这些前体的化学反应性的知识,我们能够设计一种用于生产HFSION薄膜的CVD方法。

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