STRUCTURAL AND MORPHOLOGY OF Zn_(1-x)Cu_xS FILMS AS ANTI-REFLECTING COATING (ARC) AFFECTED THE CELL PERFORMANCE

摘要

Thin films of Cu doped with ZnS were synthesized using sol-gel method to be applies as anti-reflective coating. This research involving three different Cu concentrations which being doped to the ZnS and then the thin film were heated at 550°C for 1 hour. Anti-reflecting coating is prepared by doping Cu to ZnS with the equation Zn_(1-x)Cu_xS where x = 0.00, 0.05, 0.10, 0.15 and 2.0. The effect of Cu~(2+) doping on structural, microstructural and the cell performance. The structural of ZnS:Cu thin films was characterized by X-ray diffractometer (XRD). The patterns show two consistent peaks of monoclinic structure at (2 0 0) and (1 2 2). Microstructure images of anti-reflecting layer have been observed using Scanning Electron Microscope (SEM). The images show the formation of flakes morphology. The Efficiency of the silicon solar cell has been measured using Electrochemical Impedance Spectroscopy (EIS). The efficiency of the silicon solar cell without anti-reflecting coating gave the value of 0.000008%, while efficiency of silicon solar cell with anti-reflecting coating gave the value of 0.00011%. It is clear that the result obtained has been proven, that anti-reflecting coating helps the enhancement of light absorption.