Increasing the Measurement Accuracy of a Hologram-Based CATR by Averaging in Frequency Domain

摘要

Hologram-based compact antenna test range (CATR) isa promising way to measure submm wave antennas. The hologram quality and the measurement accuracy of the hologram-based CATR is limited by the hologram manufacturing process. The measurement accuracy can be improved using pattern correction techniques. However, at submm wavelengths only the antenna pattern comparison (APC) technique is able to correct the effects of the spurious signals originating from the residual inaccuracies of the hologram pattern. A problem with the APC technique is that it is time consuming. This paper introduces a pattern correction technique for hologram-based CATRs. The technique is based on averaging in the frequency domain, and it is able to correct spurious signals originating from the hologram. Proposed technique is also faster than the APC technique. The proposed method is verified with a combination of measurements and simulations.