Fulde-Ferrell-Larkin-Ovchinnikov State in Thin Films with Rough Surfaces

摘要

We report the critical magnetic field of the second order transition from the normal state to the Fulde-Ferrell-Larkin-Ovchinnikov (FFLO) state in thin films with rough surfaces. The rough surface effects are treated using the random S-matrix theory. The film thickness dependence of the critical field and the characteristic wave number are reported.