首页> 外文会议>International Conference on Low Temperature Physics >Observation of Superconductor-insulator Transition Induced by Ge in Ultrathin a-Nb Film
【24h】

Observation of Superconductor-insulator Transition Induced by Ge in Ultrathin a-Nb Film

机译:用超薄A-NB膜诱导GE诱导超导体 - 绝缘体转变的观察

获取原文

摘要

We have observed the superconductor-insulator (S-I) transition induced by over-deposited Ge in the ultrathin amorphous Nb (a-Nb) film. The experiments are performed by depositing Ge onto the insulating a-Nb film with a thickness of 1.04 nm. For d_(Ge) > 0.3 nm, where d_(Ge) was a thickness for Ge film, the reduction of electrical sheet resistances was seen at low temperature region, suggesting superconductor. Moreover, the normal sheet resistance at 8 K decreased monotonously with increasing d_(Ge). The simplest explanation of this S-I transition is that the electron localization effect is weakened due to the addition of Ge film.
机译:我们观察到通过超沉积的GE在超薄非晶Nb(A-Nb)膜中诱导的超导体 - 绝缘体(S-I)转变。通过将Ge沉积到具有1.04nm的绝缘A-Nb膜上来进行实验。对于D_(GE)> 0.3nm,其中D_(GE)是GE膜的厚度,在低温区域下观察到电阻的降低,提示超导体。此外,8 k的正常薄层电阻随着D_(GE)的增加而单调下调。该S-I转换的最简单的解释是由于添加GE胶片,电子定位效果被削弱。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号