Development of a new X-Ray diffractomer in a reflection mode -θ/-θ for in situ characterization during crystallization processes

摘要

During the development of a robust and reproducible method for crystallization, it is essential to know all of the solid phases that may appear in suspension throughout the process. Some of these phases, such as efflorescent solvates (which transform spontaneously during the filtration or the storage) or transient metastable solids are hardly detectable and can induce troubles during the scaling up.