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A Fault Diagnosis Method for Analog Parts of Embedded Systems Based on Time Response and Identification Curves in the 3-D Space

机译:基于时间响应和3-D空间识别曲线的嵌入式系统模拟部分的故障诊断方法

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摘要

A new 3-D version of the new fault diagnosis method of analog parts in embedded mixed microsystems based on microcontrollers is presented. It has the following advantages: measurements of the CUT can be made using only internal resources of popular microcontrollers, the diagnosis procedure does not require big computing power and the codes of its procedure do not occupy much space in the program memory of the microcontroller.
机译:介绍了基于微控制器的嵌入式混合微系统中模拟零件的新故障诊断方法的新三维。它具有以下优点:可以仅使用流行的微控制器的内部资源进行切割的测量,诊断程序不需要大计算能力,并且其程序的代码在微控制器的程序存储器中不会占用太多空间。

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