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ON THE EFFECT OF SURFACE PRETREATMENT UPON THE ELECTRONIC STRUCTURE OF n-GaN SURFACES

机译:关于表面预处理对N-GAN表面电子结构的影响

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Charge transfer reactions and recombination processes were studied at the jvGaN/electrolyte interface at electrodes which were either "new"(i.e. not subjected to any pretreatment besides a 6 M HC1 dip) or photoanodieally etched in 1 M H2SO4 solutions prior to the experiments. Photocurrent multiplication studies show that that etching leads to an increase of the photocurrent multiplication factor at n-GaN in formic acid containing solutions. From impedance measurements it follows that the surface treatment provokes an irreversible shift of the flat-band potential and a curving of the Mott-Schottky plots. Electroluminescence spectra recorded in aqueous solutions containing persulfate ions at etched electrodes show a different spectral distribution as compared to spectra, recorded at new electrodes. These results can be explained by an effect of photoanodic etching upon the nature and/or concentration of intrinsic surface states at or in the vicinity of the n-GaN surface.
机译:在诸如“新建”的电极的JVGAN /电解质界面处研究了电荷转移反应和重组过程,除了在实验之前在1M H 2 SO 4溶液中进行光秃秃的蚀刻除了6MHC1浸渍之外的任何预处理。光电流乘法研究表明,蚀刻导致含甲酸溶液中N-GaN的光电流倍增因子的增加。从阻抗测量开始,表面处理引起了平带电位的不可逆偏移和Mott-肖特基图的弯曲。记录在蚀刻电极的过硫酸盐离子的水溶液中记录的电致发光光谱显示出与在新电极上记录的光谱相比的不同的光谱分布。这些结果可以通过光秃秃的蚀刻对N-GaN表面附近或在N-GaN表面附近的本质和/或浓度的作用来解释。

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