Single-trial event-related potentials with wavelet denoising: method and applications

摘要

We describe a method based on the wavelet transform for denoising single-trial event-related potentials (ERPs). The identification of the event-related responses in the single-trials allows the study of latency jitters and cognitive processes, such as habituation, sensitization and learning. Since the method is fast and parameter free, it could complement ERP conventional analysis.