首页> 外文会议>Measurement Science Conference >STATIC SYNERGETICS ALGORITHM: A NEW VERSATILE TOOL FOR REAL-TIME QA WITH INTERACTIVE FEEDBACK TO PROCESS QC QUALITY AND YIELD OPTIMIZATION OF MATERIALS AND DEVICES
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STATIC SYNERGETICS ALGORITHM: A NEW VERSATILE TOOL FOR REAL-TIME QA WITH INTERACTIVE FEEDBACK TO PROCESS QC QUALITY AND YIELD OPTIMIZATION OF MATERIALS AND DEVICES

机译:静态协同算法:具有交互式反馈的实时QA的新多功能工具,用于处理QC质量和材料和设备的优化

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摘要

The time-independent, static limit of Haken's synergetics, the dynamics of pattern evolution out of chaos, in analogy with material, device, or system evolution out of input materials during processing, is used as a universal, scalable, reversible, mathematical algorithm and or experimental model (not a theory nor process (specific) model) to provide a real-time, interactive quality assurance (QA) and feedback to quality-control (QC) to be coupled in parallel to a specific particular process theory or model. The input to processing QA and QC is its output, any of the complex, frequency-dependent electronic, electrical, dielectric, mechanical/viscoelastic, optical or magnetic property Functions of the processing produced defect/imperfection disorder distribution Pattern at that particular moment in the processing, the instantaneous Pattern input of an external radiation diffraction-pattern. The Algorithm provides a flexible versatile tool to relate processing induced defect distribution Pattern universally to Function/functional property performance, as designer and/or user specification, no matter however (mode physics/chemistry, ...specificity) in the processing the defects are produced, on the scales of material, device or system/IC. Additionally the Algorithm can be utilized in forward Pattern input-Function output, or a backward Function input-Pattern output to trace back from Function specification failure to defect distribution Pattern cause.
机译:Haken的协同凝判性的时间独立静态极限,在加工过程中的输入材料类别中的混沌中的模式演化的动态传感器的动态被用作通用,可扩展,可逆,数学算法和或实验模型(不是理论也不是工艺(具体)模型),以提供实时,交互式质量保证(QA)和反馈到质量控制(QC),以与特定的特定过程理论或模型平行耦合。加工QA和QC的输入是其输出,任何复合,频率相关的电子,电介质,机械/粘弹性,光学或磁性特性,在该特定时刻产生缺陷/缺陷紊乱分布模式处理,外部辐射衍射图的瞬时图案输入。该算法提供了一种灵活的多功能工具,以普遍普遍普遍掌握处理引起的缺陷分布模式,作为设计者和/或用户规范,无论(模式物理/化学,......特异性)在处理中缺陷在材料,设备或系统/ IC的尺度上生产。另外,该算法可以用于转发图案输入功能输出,或向后函数输入模式输出以从功能规范失败追溯到缺陷分布模式原因。

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