STUDY ON STRESS IN THE SURFACE LAYER OF BERYLLIUM ALONG DEPTH DISTRIBUTION BY X-RAY METHOD

摘要

X-ray stress analysis is a nondestructive test method based on the X-ray diffraction principle. Applied to beryllium, due to its lower density and little mass absorption coefficient for X-ray, the X-ray penetration depth is rather large. Therefore, the total average stress in the surface layer of beryllium can be measured by the X-ray method, but usually an uneven stress distribution in beryllium is existed, there would be some errors if the conventional X-ray stress analysis is adopted, moreover, the stress along depth distribution can't obtained. According to the X-ray penetration depth as a function of the inclination angles during X-ray stress analysis, a novel stress measurement method has been set up in this paper, which can measure the stress along depth distribution in the surface layer of beryllium. The feasibility of the method has been validated using the cantilever beam loading experiment of beryllium specimen.