Testing the Wafer V-Cone Flowmeters in accordance with API 5.7 'Testing Protocol for Differential Pressure Flow Measurement Devices' in the CEESI Colorado Test Facility

摘要

The paper describes the testing of the Wafer V-Cone Meters in accordance with the new APl 5.7 "Testing Protocol for Differential Pressure Flow Measurement Devices" in the Colorado Test Facility. This paper will report on the use of this new APl standard and some of the points which had to be addressed in order to implement the standard. The results of the testing 2" and 4" Wafer V-Cone meters in water and in gas will be presented. The non-standard testing requirements in the standard will provide evidence of the conditioning effect of the V-Cone as it meters the fluid. The conclusions reached were: APl 5.7 tests the claims of the meter manufacturer regarding the product in a demanding manner. As the procedure is implemented the need to make amendments will become apparent and this paper will address some of the limitations which became evident while testing. The results of the Wafer V-Cone Testing Uncertainty will be discussed.