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Strong picosecond ultrasonic responses of semiconductors probed close to interband transitions

机译:强大的PicoSecond超声波响应探测接近的间带式过渡

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We present experimental and numerical results of picosecond ultrasonic experiments performed in different semiconductors at different laser wavelengths. We first come back on the strong oscillations which appear in the reflectivity curves of silicon as the probe pulse is tuned in the blue range. We show that they come from an effect of the electronic transitions on the piezo-optic couplings. We then present similar results obtained in germanium which displays three interband transitions which fall in our laser source tuning range: 3.11, 2.11 and 0.8 eV (399, 587 and 1540 nm). Here again we have noticed strong responses in the reflectivity curves. We then make a comparison between silicon and germanium in respect with the laser wavelength effects.
机译:我们在不同的激光波长的不同半导体中呈现皮秒超声实验的实验性和数值结果。我们首先回到硅的反射率曲线上的强振荡,因为探头脉冲在蓝色范围内调谐。我们表明它们来自电子转换对压电联轴器的影响。然后,我们在锗中获得类似的结果,该结果显示出三个间带转换,该转换落入我们的激光源调谐范围:3.11,2.11和0.8eV(399,587和1540nm)。我们再次注意到反射率曲线的强烈反应。然后,我们在激光波长效应方面进行硅和锗之间的比较。

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