Crystal structure and critical properties of HTSC 2G prototypes formed by pulsed laser deposition technique on the RABiTS tapes

摘要

HTSC 2G YBCO based short samples were formed by PLD (pulsed laser deposition) on the cube textured Ni-W tapes. The influence of buffer layer architecture on the critical properties of HTS films was investigated with scanning and transmission electron microscopy, X-ray diffraction and four point probe electrical measurement. The best critical properties were found in the HTS grown on tapes with triple buffer layers:Y_2O_3, YSZ and CeO_2. After CeO_2 layer deposition the blister-like defects appeared on the buffers surface. These defects being inherited by YBCO film could lead to degradation of critical properties.