General interferometric approaches based on variable incidence angle method for refractive index and thickness measurement of birefringent multi-medium objects

摘要

The optical properties of the birefringent multi-objects (heterogeneous objects) can simply be determined if the thickness of each layer is known. The highly accurate measurement of the thickness of each layer of the birefringent multi-object is not trivial operation and it should be performed with more care. Therefore, oblique incidence Pluta birefracting microinterferometer is used for highly accurate thickness measurement. In the presented paper, two general interferometric approaches are used for refractive indices and thickness measurement of each layer of the birefringent multi-medium objects. This measurement can be done when only the extraordinary fringe deflection in the image of each layer is measured as function of the incidence angle.