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Extrinsic carrier self-trapping and metal-insulator transitions in doped high-T_c cuprates

机译:外部载体自捕集和金属绝缘体在掺杂的高T_C铜铝酸盐中过渡

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The self-trapping of hole carriers near the dopants (or impurities) and the metal-insulator transitions (MITs) were studied theoretically. The ground state energies of the carriers interacting with impurities and lattice vibrations as well as with each other in the three-dimentional polar cuprates are calculated variationally within the continuum model and adiabatic approximation. We have shown that the extrinsic self-trapped states (i.e. bound states of the impurity and large (bi)polarons) are formed in the charge-transfer gap of the lightly doped cuprates and these localized impurity states form the narrow in-gap impurity bands. The MITs in the cuprates occur when the in-gap impurity bands merge with the oxygen valence band at some critical hole concentrations. We have obtained the quantitative criterion for the MIT driven by the extrinsic carrier self-trapping.
机译:从理论上研究了掺杂剂(或杂质)附近的空穴载体的自捕获和金属绝缘体过渡(MITS)。在连续模型和绝热近似下,在三维极性铜酸盐中与杂质和晶格振动相互作用的载体的接地状态能量以及彼此相互作用。我们已经表明,在轻掺杂的铜酸盐的电荷转移间隙中形成外部自捕集状态(即杂质和大(Bi)极化的结合状态,并且这些局部杂质态形成窄间隙杂质带。当间隙杂质带在一些临界空穴浓度下与氧气价带合并时,将发生铜酸盐的婴儿。我们已经获得了由外在载体自捕获驱动的麻省理工学院的定量标准。

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