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Studies on the Thermal Stability of Nano-SiC Powder with Excessive Free Carbon by Thermal Analysis-Mass Spectrometry Coupling Technique

机译:通过热分析质谱耦合技术研究纳米粉末粉末​​粉末热稳定性的研究

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TG-DSC-MS coupling technique is used to study the thermal stability of the nano -SiC powder with excessive free carbon. X-ray diffraction (XRD) is used to characterize the phase structure of the nano-SiC powder. TEM is used to observe the particle size and the shape of the nano-SiC powder with excessive free carbon around the thermal treatment. The TEM results are showing no difference with that obta ined by thermal analysis mass spectrometric technique
机译:TG-DSC-MS耦合技术用于研究纳米-SIC粉末的热稳定性过多的游离碳。 X射线衍射(XRD)用于表征纳米粉末的相结构。 TEM用于观察颗粒尺寸和纳米粉末的形状,在热处理周围具有过量的游离碳。 TEM结果表明热分析质谱技术的热量差异没有差异

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