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Study of an ion-ion plasma by biasing a large planar probe with square waveforms

机译:用方波偏置大平面探头来研究离子离子等离子体

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An electrical study of an ion-ion plasma by an intrusive planar probe biased with a square waveform is presented here. The experiments are performed in the downstream chamber of a Helicon source in a "pure" ion-ion plasma region in SF6. For frequencies in the kHz range applied to the planar probe, the positive and negative ions saturations currents are alternately measured following the applied waveform. Whereas for low frequencies (in the Hz range), we observe a decrease of the negative ion saturation current collected on the probe during the positive bias period, while the positive ion saturation current is constant versus time. We suggest that the phenomenon is due to a dielectric layer deposited on the reactor walls. When negative ions are collected on the probe, the plasma compensate the lost of negative charge by positive charge going to the wall. Due to the dielectric layer on the reactor walls this positive ion current is limited. However, for the positive ions collected on the probe, the current is instantly compensated by mobile electrons flowing along the field lines.
机译:这里介绍了用方形波形偏置的侵入式平面探针对离子离子等离子体的电气研究。实验在SF6中的“纯”离子离子等离子体区域中的Helicon源的下游室中进行。对于施加到平面探针的KHz范围中的频率,在施加的波形之后交替测量正离子饱和电流。虽然对于低频(在Hz范围内),但在正偏置时段期间观察探针上收集的负离子饱和电流的减小,而正离子饱和电流是恒定的与时间恒定。我们建议该现象是由于沉积在反应器壁上的介电层。当在探针上收集负离子时,等离子体通过向壁上的正电荷补偿负电荷损失。由于反应器壁上的介电层,该正离子电流是有限的。然而,对于收集在探针上的正离子,电流通过沿着场线流动的移动电子立即补偿。

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