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Polyelectrolyte Effects in Model Photoresist Developer Solutions: Roles of Base Concentration and Added Salts

机译:模型光致抗蚀剂显影剂溶液中的聚电解质作用:基础浓度和添加盐的作用

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We demonstrate that poly(4-hydroxystyrene) and (5, 15, and 20) % tert-butoxycarboxy protected copolymers are polyelectrolytes when dissolved in aqueous base solutions. The polyelectrolyte effect is quantified through the observation of a correlation peak, measured with small-angle neutron scattering. Polyelectrolyte effects are weakened with added salts and excess base. These studies emphasize that salt additives screen the electrostatic interactions, while pH leads to the ionization of the chain. Solvent quality is quantified and the chain configurations are measured in the limit of high ionic strength. It is speculated that the developer-resist interactions will play an important role in development-induced roughness, hence these equilibrium solution measurements can serve a predictive function for future photoresists dissolution models incorporating solvent quality as a parameter.
机译:我们证明了聚(4-羟基苯乙烯)和(5,15和20)%叔丁氧基羧基保护的共聚物是溶解在碱溶液中时的聚电解质。通过观察用小角度中子散射测量的相关峰值来定量聚电解质效应。用添加的盐和过量碱削弱聚电解质效果。这些研究强调盐添加剂筛选静电相互作用,而pH导致链的电离。量化溶剂质量,并在高离子强度的极限下测量链构型。据推测,显影剂抗蚀剂相互作用将在发育诱导的粗糙度中发挥重要作用,因此这些平衡溶液测量可以用于将未来的光致抗蚀剂溶解模型作为参数的预测功能。

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