首页> 外文会议>Topical Conference on Radio Frequency Power in Plasmas >A Multichannel Reflectometer for edge Density Profile Measurements at the ICRF Antenna in ASDEX Upgrade
【24h】

A Multichannel Reflectometer for edge Density Profile Measurements at the ICRF Antenna in ASDEX Upgrade

机译:ASDEX升级中ICRF天线的边缘密度剖面测量的多声道反射仪

获取原文

摘要

A multichannel reflectometer will be built for the new three-straps ICRF antenna of ASDEX Upgrade (AUG), to study the density behavior in front of it. Ten different accesses to the plasma are available for the three reflectometer channels that can be interchanged without breaking the machine vacuum. Frequency is scanned from 40 GHz to 68 GHz, in 10μs, which corresponds to a cut-off density ranging from 10~(18) ÷ 10~(10)m~(-3) in the Right cut-off of the X-mode propagation, for standard toroidal magnetic field values of AUG.
机译:将构建多通道反射仪,为ASDEX升级(AUG)的新三针ICRF天线,以研究其前面的密度行为。在不破坏机器真空的情况下,可以互换的三个不同的距离等离子体的不同访问。频率从40 GHz到68 GHz,10μs扫描,这对应于X-(右侧)的10〜(18)×10〜(10)m〜(-3)的截止密度。模式传播,用于八个标准环形磁场值。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号