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Resolution Test Technique and Influencing Factors Analysis of a Low-background Anti-Compton HPGe γ -ray Spectrometer

机译:低背景抗康顿HPGEγ-射线光谱仪的分辨率测试技术及影响因素分析

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This paper tests the resolutions under different high voltages, electronics and source’s position of a low-background anti-Compton HPGe γ -ray spectrometer. The experimental results show that these factors have important influence on resolution. It is experimentally confirmed that the spectrometer can reaches at the best resolution of 1.77keV at a high voltage of 3250V under the condition of suited electronics and proper position of the source.
机译:本文在低背景抗康顿HPGEγ-射线光谱仪下测试了不同高压,电子和源的位置下的分辨率。实验结果表明,这些因素对分辨率具有重要影响。实验证实,光谱仪在高电压为1.77kev的最佳分辨率,在适用的电子设备和源的适当位置,在3250V的高压下达到1.77kev。

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