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Effects of heavy nitrogen doping in Ⅲ-Ⅴ semiconductors - How well does the conventional wisdom hold for the dilute nitrogen “Ⅲ-Ⅴ-N alloys'?

机译:Ⅲ-Ⅳ半导体重氮掺杂的影响 - 常规智慧对稀氮“Ⅲ-Ⅳ-N合金的常规智慧的影响”?

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Although heavily N doped Ⅲ-Ⅴ semiconductors are frequently referred to as dilute nitrogen Ⅲ-Ⅴ-nitride alloys in general, it is important to realize that there are some subtle but important differences among them. In the indirect gap semiconductor GaP, since even a single N impurity can have a bound state, as far as the absorption near the band gap is concerned, it is difficult to describe GaP: N as an alloy. The N induced bound states (a hierarchy of impurity complexes) can in fact give rise to rather strong absorption below the indirect band gap, which effectively reduced the energy of the "absorption edge", but the position of the absorption edge cannot be defined in a conventional way. In the direct gap semiconductor GaAs, a single N impurity does not form a bound state but instead has a resonant state above the conduction band edge. In this aspect, GaAs: N is similar to the situation in a conventional alloy, say, GaAs : P, except that the perturbation of N to the host is much stronger than that of P. However, because in reality N incorporation is typically in a random manner and a cluster as small as one N pair can generate bound states, the permissible region for GaAs: N to behave as a regular alloy is in fact rather limited, i.e., only when the N concentration is low enough so that the N pair and cluster states do not significantly interact with the host. In this study, a precise tracking of the evolution of the host and N induced impurity states will be offered for the two prototype systems, GaAs: N and GaP: N, with x varying from as low as ~10~(-5) to ~10~(-2). Such a study gives valuable insight to the underlying physics of the material evolution, sets up a bench-mark for testing the theoretical modeling of this type of system, and serves to enhance our understanding of the behavior of isoelectronic impurities in semiconductors in general. The dissimilarity between GaP: N and GaAs: N indicates that seeking a unified model for all the isoelectronic doping systems is unrealistic. Our study also indicates that for strongly perturbed systems like GaP: N and GaAs: N, certain materials properties could be less well defined or not uniquely defined, as compared to those in other conventional semiconductor alloys.
机译:虽然大量N掺杂Ⅲ-α半导体通常被称为稀氮Ⅲ-β-氮化物合金,但重要的是意识到它们之间存在一些微妙但重要的差异。在间接间隙半导体间隙中,由于即使是单个N杂质可以具有粘合状态,就涉及带隙附近的吸收而言,难以描述间隙:n作为合金。 N诱导的界定状态(杂质复合物的层次)实际上可以产生相当强的间接带隙的吸收,这有效地降低了“吸收边缘”的能量,而是不能限定吸收边缘的位置一种传统方式。在直接间隙半导体GaAs中,单个N杂质不形成绑定状态,而是在导通带边缘上方具有谐振状态。在这方面,GaAs:n类似于传统合金的情况,例如,GaAs:p,除了N到宿主的扰动比P的扰动远比p。然而,因为在现实中,N掺入通常是随机方式和一个小作为一个n对的簇可以产生界定状态,对于常规合金的GaAs的允许区域实际上是有限的,即,只有当n浓度足够低时,才能足够低对和群集状态不会显着与主机交互。在这项研究中,将在两个原型系统,GaAs:N和Gap:n,x从低于〜10〜(-5)的x x,精确地跟踪宿主和n个诱导的杂质状态〜10〜(-2)。这样的研究为材料演化的潜在物理提供了有价值的见解,建立了测试这种类型系统的理论建模的台式标记,并用于提高我们通常对半导体中的等电子杂质的行为的理解。间隙之间的不相似性:N和GaAs:n表示寻求所有等电子掺杂系统的统一模型是不现实的。我们的研究还表明,对于像间隙的强烈扰动的系统:N和GaAs:N,与其他常规半导体合金中的那些相比,某些材料特性可以不太明确或不定义。

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