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An investigation into applying self-calibration techniques to measuring large optical components on a CMM

机译:应用自校准技术在CMM上测量大型光学元件的研究

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Any measurement of an artefact on a CMM (co-ordinate measuring machine) will include contributions from the systematic errors of the machine, the random errors in the machine and also the actual geometry of the artefact. If an artefact is rotated (or translated) within the CMM measuring volume, such that the chosen measurement points on the artefact continue to map onto the same machine coordinates, then the component of the measurement due to the artefact geometry will rotate, whilst the component due to the machine systematic errors will remain in the same position. In the self-calibration technique, a set of measurements of this type is made, and from these the systematic errors of the machine can be identified. The measurement accuracy of the artefact geometry is then only limited by the random component of the machine error, which is generally smaller than the systematic errors of the machine. This paper reviews self-calibration techniques and assesses their feasibility for improving the uncertainty of form measurement of large optical surfaces on a coordinate measuring machine.
机译:CMM(坐标测量机)上的人工制品的任何测量将包括从机器系统错误的贡献,机器中的随机误差以及人工制品的实际几何形状。如果在CMM测量体积内旋转(或翻译)的人工制品,使得人工制品上的所选择的测量点继续地映射到同一台机器坐标上,则由于人工制品几何形状导致的测量部件将旋转,而部件由于机器系统错误将保持在相同位置。在自校准技术中,进行了一组测量这种类型的测量,并且可以识别这些机器的系统误差。然后,人工制品几何的测量精度仅受机器误差的随机成分限制,这通常小于机器的系统误差。本文评论了自我校准技术,并评估了改善坐标测量机上大型光学表面的形式测量的不确定性的可行性。

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