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Primary level gauge block interferometers for realization of the SI length uni

机译:用于实现SI长度UNI的主级计块干涉仪

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The main features of the small Carl Zeiss comparator (for the gauge blocks up to 100 mm), and a large Kosters interferometer (for gauge blocks up to 1000mm) are discussed in some detail. Special emphasis is made on the problem, requirements and specific feature of the differntial optical measurements, which become feasible with these new devices. Very high resolution of the instruments, resulting in resolving the oblique incidence effects for "sad" and "smile" type of interferograms, which correspond to different directions in the measurement of the fringe fraction values, imposes some restrictions on the measurement procedure, realized with their use. For example, the the optimum parameters of the interferogram, which are required for the most accurate and reliable operation of the fringe-pattern analyzing comparators, the measurement can be performed for only one type of interferogram ("sad" in our case), and for the measurements of the other type ("smile") a new optical tuning of the interferometer is required. The problems of temperature measurements with a sub-mK accuracy level are formulated, and the ways to overcome them are outlined.
机译:小型Carl Zeiss比较器的主要特点(用于高达100毫米的规格块),以及一些细节讨论了大型转盘干涉仪(用于高达1000mm的规格块)。特殊重点是对不同光学测量的问题,要求和特定特征进行了差异,这与这些新设备变得可行。仪器的非常高分辨率,导致解决“悲伤”和“微笑”类型的干涉图的倾斜发射效果,这对应于在测量边缘级分值中的不同方向,对测量程序施加了一些限制,实现了他们的使用。例如,干扰图的最佳参数,这对于边缘图案分析比较器的最准确和可靠的操作所需的参数,可以仅对某种类型的干涉图(在我们的情况下)进行测量),并且对于其他类型的测量(“微笑”),需要新的干涉仪的光学调谐。配制了具有子MK精度水平的温度测量问题,概述了克服它们的方法。

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