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Compression Molding for Thin PoP Top Packages

机译:用于薄壁顶部包装的压缩成型

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The package on package (PoP) has become the preferred method for vertical stacking of logic processors and memory in mobile applications. The industry is constantly working toward reducing the total stack height, and current road maps point toward a total stack Z-height of 1mm. One approach to reduce the package height is to reduce the mold cap thickness as well as reduce the mold cap clearance (the distance between the top silicon die to the mold top). In this study, we used the compression molding for manufacturing top PoP packages with 200μm, 250μm, 300μm, and 350μm mold cap and with sub-100μm mold cap clearance. As part of the mold material selection, two different form factors, granular and powder form, of the mold compound were used for the compression mold process. The key objective for this study is to investigate compression mold process and to study its effect on the package integrity. The major challenge for PoP stack up is the package warpage at reflow temperatures. All the PoP packages must meet certain critical warpage criterion to meet board mount yield requirements. Warpage of the packages was measured by the shadow moiré method, and the warpage results for the packages molded by the transfer mold were compared against that of the compression molded packages. Results indicate that there is considerable difference in warpage behavior betwee n the pellet and powder form of the same mold compound. However, the granular form of the same mold compound resulted in similar warpage behavior of the pellet form mold compound. Further analysis was done to compare the filler distribution in the mold for transfer versus the compression mold process. Results indicate much uniform filler distribution in compression mold furthering evidence that the warpage for the unit level package will be uniform across the strip. Warpage results were analyzed using finite element methods, and the results are extrapolated to different package XY dimensions. The data obtained from these experiments show that the compression mold method can be potentially implemented for thin PoP top packages in the future.
机译:包装(POP)上的包已成为移动应用中垂直堆叠逻辑处理器和内存的首选方法。该行业不断努力减少总堆叠高度,电流路线图指向总堆叠Z高度1mm。减少包装高度的一种方法是减小模具盖厚度,并减小模具盖间隙(顶部硅模具与模具顶部之间的距离)。在这项研究中,我们使用200μm,250μm,300μm和350μm模具盖和350μm模具盖清关制造顶部弹出封装的压缩模塑。作为模具材料选择的一部分,使用模具化合物的两种不同的形状因子,粒状和粉末形式用于压缩模具方法。本研究的关键目标是调查压缩模具过程,并研究其对包装完整性的影响。弹出堆叠的主要挑战是回流温度下的包装翘曲。所有POP包都必须符合某些关键的翘曲标准,以满足电路板安装产量要求。通过影子莫尔方法测量包装的翘曲,并将通过转移模具模制的包装的翘曲结果与压缩模塑包装的展开。结果表明,在相同模具化合物的颗粒和粉末形式之间存在翘曲行为的相当差异。然而,相同模塑化合物的颗粒形式导致颗粒形成模具化合物的类似翘曲行为。进行进一步分析以比较模具中的填充物分布,用于转移与压缩模具过程。结果表明压缩模具中的大量均匀填充物分布,进一步提高了单位封装的翘曲在整个条带中将是均匀的。使用有限元方法分析翘曲结果,结果将结果推断为不同的封装XY尺寸。从这些实验中获得的数据表明,可以在未来潜在地实现压缩模具方法。

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