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DIRECT DEPOSITION OF TEXTURED ZnO:Al TCO FILMS BY RF SPUTTERING METHOD FOR THIN FILM SOLAR CELLS

机译:通过RF溅射方法直接沉积纹理ZnO:Al TCO薄膜,用于薄膜太阳能电池

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Textured thin films ZnO has been successfully grown by rf magnetron sputtering method using a special technique of introducing a small amount of water and methanol on the deposition chamber. The surface morphology of the films has pyramidal structure and the degree of texture is dependent on the Ar ambient pressure. The pressure in this experiment varied from 50 mTorr to 5 mTorr and the highest grain size of the film is obtained at 5 mTorr. The total transmittance of the films are more than 85% in the wavelength of 400 to 800 nm, and haze ratio of about 14% is obtained at 400 nm wavelength. Beside the textured surface, these films also have very low resistivity, lower than 1.4×10{sup}(-3) cm. X-ray diffraction (XRD) analysis of the films showed the clear change of film growth from columnar to granular growth when the water or methanol was added during sputtering process. The granular growth of the films was closely related to the amount of OH molecules in the films.
机译:纹理薄膜ZnO已通过RF磁控溅射方法成功地使用了在沉积室上引入少量水和甲醇的特殊技术。薄膜的表面形态具有锥形结构,质地程度取决于AR环境压力。该实验中的压力在50mTorr至5mtor中变化,在5mtorr处获得薄膜的最高粒度。薄膜的总透射率在400至800nm的波长下大于85%,并且在400nm波长下获得约14%的雾度比。除了纹理的表面旁边,这些薄膜还具有非常低的电阻率,低于1.4×10 {sup}( - 3)cm。当在溅射过程中加入水或甲醇时,薄膜的X射线衍射(XRD)分析表明,当在溅射过程中加入水或甲醇时,胶片生长的薄膜生长变化。薄膜的粒状生长与薄膜中的OH分子的量密切相关。

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