This work utilizes pulsed, melt-mediated laser crystallization techniques to control the spatial distribution of crystalline zones within an as sputter-deposited amorphous matrix. Since shape memory responses stem from crystallographic shifts, only the selectively crystallized regions exhibit these properties. This process provides not only spatial control over the shape memory response, but potentially, through proper use of operational parameters, the shape memory response itself, i.e. phase transformation temperature, transformation strain, recovery stress etc. The solidification process is monitored in situ via transient reflectance. Furthermore, the effects of varying energy density within the irradiated region are examined with respect to the resulting micro-structure via atomic force microscopy (AFM), electron backscatter diffraction (EBSD) and x-ray diffraction (XRD).
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