Advanced Studies of Medium-mass Ion Sources-1: Effect of Beam Neutralization on Beam Micro-divergence Angle

机译：中质量离子源-1的高级研究 - 1：光束中和对光束微发散角的影响

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Effect of beam neutralization on the beam micro-divergence angle was investigated for proton beam with hydrogen gas puff. About 10% reduction of the angle was observed preliminary.

机译：用氢气粉扑对质子梁研究光束中和对光束微发散角的影响。观察到初步的角度减少约10％。

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《International Conference on High-Power Particle Beams》|2002年||共4页
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Koichi Kasuya; Seimei Araya; Takahiro Kamiya;
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中图分类 O4-53;
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专利

1. Electron beam probe for charge neutralization studies of heavy ion beams [J] . Review of Scientific Instruments . 1983,第1期

机译：电子束探针，用于重离子束的电荷中和研究
2. Narrow beams in scattering media: the advanced small-angle approximation [J] . Yaroslaw A. Ilyushin, Vladimir P. Budak Journal of the Optical Society of America, A. Optics, image science, and vision . 2011,第7期

机译：散射介质中的窄束：先进的小角度近似
3. Neutralized ion beam modification of cellulose membranes for study of ion charge effect on ion-beam-induced DNA transfer [J] . K. Prakrajang, K. Sangwijit, S. Anuntalabhochai, Nuclear Instruments & Methods in Physics Research . 2012,第Feba1期

机译：纤维素膜的中和离子束修饰研究离子电荷对离子束诱导的DNA转移的影响
4. Advanced Studies of Medium-mass Ion Sources-1: Effect of Beam Neutralization on Beam Micro-divergence Angle [C] . Koichi Kasuya, Seimei Araya, Takahiro Kamiya International Conference on High-Power Particle Beams . 2002

机译：中质量离子源-1的高级研究 - 1：光束中和对光束微发散角的影响
5. Development of a high-resolution soft x-ray (30-1500 eV) beamline at the advanced light source and its use for the study of angle-resolved photoemission extended fine structure. [D] . Huff, Welcome Rex Anthony. 1996

机译：在先进光源下开发高分辨率软X射线（30-1500 eV）光束线，并将其用于角分辨光发射扩展精细结构的研究。
6. 3D reconstruction of scintillation light emission from proton pencil beams using limited viewing angles – a simulation study [O] . CheukKai Hui, Daniel Robertson, Sam Beddar -1

机译：有限视角下质子笔束闪烁光的3D重建–模拟研究
7. Electron beam probe for charge neutralization studies of heavy ion beams [O] . J. Shiloh, M. Lampel, R. Sah 1983

机译：用于电离子束的电荷中和研究的电子束探头
8. Electron Beam Probe for Charge Neutralization Studies of Heavy Ion BEAMS [R] . Shiloh, J., Lampel, M., Sah, R. 1982

机译：用于重离子束BEams电荷中和研究的电子束探针

Advanced Studies of Medium-mass Ion Sources-1: Effect of Beam Neutralization on Beam Micro-divergence Angle

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