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Measurement of the Switching Activity of CMOS Digital Circuits at the Gate Level

机译:栅极电平测量CMOS数字电路的切换活动

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Accurate estimation of switching activity is very important in digital circuits. In this paper we present a comparison between the evaluation of the switching activity calculated using logic (Verilog) and electrical (HSPICE) simulators. We also study how the variation on the delay model (min, typ, max) and parasitic effects affect the number of transitions in the circuit. Results show a variable and significant overestimation of this measurement using logic simulators even when including postlayout effects. Furthermore, we show the contribution of glitches to the overall switching activity, giving that the treatment of glitches in conventional logic simulators is the main cause of switching activity overestimation.
机译:切换活动的准确估计在数字电路中非常重要。在本文中,我们在使用逻辑(Verilog)和电气(HSPICE)模拟器的计算值之间的评估之间的比较。我们还研究延迟模型的变化(Min,典型,最大值)和寄生效应如何影响电路中的转换次数。结果表明,使用逻辑模拟器,即使在包括后结效果时也显示了这种测量的变量和显着高度估计。此外,我们展示了故障对整体切换活动的贡献,使传统逻辑模拟器中的毛刺的处理是切换活动高估的主要原因。

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