Core-clustering based SoC test scheduling optimization

摘要

In this paper, a method is presented to schedule tests for core-based SoCs to achieve optimal test completion time for the SoC design by simultaneously determining optimal core clustering, core cluster wrapper width, and pin mapping. For the first time the above mentioned techniques are applied concurrently to solve the SoC test scheduling problem. A heuristic algorithm implementing these techniques to determine an optimal solution is proposed.