首页> 外国专利> Method and apparatus for learning CNN-based object detector using 1×1 convolution used for hardware optimization, test method and apparatus using the same {LEARNING METHOD AND LEARNING DEVICE FOR OBJECT DETECTOR BASED ON CNN USING 1x1 CONVOLUTION TO BE USED FOR HARDWARD OPTIMIZATION, AND TESTING METHOD AND TESTING DEVICE USING THE SAME}

Method and apparatus for learning CNN-based object detector using 1×1 convolution used for hardware optimization, test method and apparatus using the same {LEARNING METHOD AND LEARNING DEVICE FOR OBJECT DETECTOR BASED ON CNN USING 1x1 CONVOLUTION TO BE USED FOR HARDWARD OPTIMIZATION, AND TESTING METHOD AND TESTING DEVICE USING THE SAME}

机译:使用用于硬件优化的1×1卷积学习基于CNN的目标检测器的方法和装置,使用其的测试方法和装置{基于CNN的对象检测器的学习方法和学习装置,使用1x1卷积进行难于优化的方法,以及使用相同的测试方法和测试设备}

摘要

PROBLEM TO BE SOLVED: To provide a learning method, a learning device, a test method and a test device for a CNN-based object detector capable of reducing the amount of calculation. A learning method includes a step of generating an initial feature map using a convolution layer 121 and an integrated feature map using a first transpose layer 124, and a first 1x1 convolution layer 125 and a second 1x1 convolution layer. The detection layer 129 is generated based on the step of generating the second adjustment feature map whose volume is adjusted by the volume layer 126 and the object class information generated by the pixel-by-pixel feature map obtained by separating the volume-adjusted feature map for each pixel. By calculating the object detection loss by referring to the object detection information generated by the above and the original correct answer, at least a part of the convolution layer 121, the first 1x1 convolution layer 125, and the second 1x1 convolution layer 126 Learning parameters. [Selection diagram] Figure 2
机译:解决的问题:提供一种能够减少计算量的基于CNN的物体检测器的学习方法,学习设备,测试方法和测试设备。一种学习方法包括以下步骤:使用卷积层121生成初始特征图,并使用第一转置层124,第一1x1卷积层125和第二1x1卷积层来生成综合特征图。基于生成第二调整特征图的步骤来生成检测层129,该第二调整特征图的体积由体积层126调整,并且该对象分类信息由通过将体积调整后的特征图分离而得到的逐像素特征图生成。对于每个像素。通过参考由以上产生的对象检测信息和原始正确答案来计算对象检测损耗,卷积层121,第一1x1卷积层125和第二1x1卷积层126的至少一部分学习参数。 [选择图]图2

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号