Time slot specification based approach to analog fault diagnosis using built-in current sensors and test point insertion

摘要

Testing and diagnosis of analog circuits continues to be a hard task for test engineers and efficient test methodologies to tackle these problems are needed. This paper proposes a novel analog test method using time slot specification (TSS) based built-in current sensor A technique for location of a fault site and fault type based on TSS is presented. The proposed built-in current sense and decision module (BSDM) in association with TSS analysis has high testability and good fault coverage, and a capability to diagnose catastrophic faults and parametric faults in analog circuits. The digital output of BSDM can be easily combined with built-in digital test modules for mixed-signal IC testing. The general heuristics for test point placements are also described.