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Proposal of a vibrating touch probe for on-machine measurement of optical elements

机译:用于光学元件的机上测量的振动触摸探头的提议

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A novel vibrating touch probe is proposed for on-machine measurement of small optical elements machined on ultraprecision machine tools. Advantage of the proposed probe is its low measuring force that can be less than 50μN (5mgf). Maximum measurable contact angle of the probe is larger than 60 degrees. Therefore, the probe is suitable for measuring a hemispherical lens and its die. The probe is excited by a piezoelectric actuator in a sinusoidal manner. When the probe touches an object, the probe vibration becomes distorted, and harmonics appear in the vibration spectrum. It is judged that the probe touches the object at the point where the power of the second harmonic exceeds a threshold level. The performance of the probe is evaluated by measuring the form of a spherical lens die of 4.2mm in diameter. The result of the measurements is examined and the on-machine measurement using the proposed probe is discussed.
机译:提出了一种新颖的振动触摸探头,用于在UltrafiStion机床上加工的小型光学元件的机上测量。所提出的探针的优点是其低测量力,可小于50μN(5mgF)。探针的最大可测量接触角大于60度。因此,探针适用于测量半球形透镜及其模具。探针以正弦方式由压电致动器激发。当探头触摸物体时,探针振动变形,谐波出现在振动频谱中。判断探头在第二次谐波的功率超过阈值水平的点处触摸对象。通过测量直径4.2mm的球形透镜模具的形式来评估探针的性能。检查测量结果,并讨论了使用该探针的机机测量。

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