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Proposal of a vibrating touch probe for on-machine measurement of optical elements

机译:振动式测头在机上测量光学元件的建议

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A novel vibrating touch probe is proposed for on-machine measurement of small optical elements machined on ultraprecision machine tools. Advantage of the proposed probe is its low measuring force that can be less than 50μN (5mgf). Maximum measurable contact angle of the probe is larger than 60 degrees. Therefore, the probe is suitable for measuring a hemispherical lens and its die. The probe is excited by a piezoelectric actuator in a sinusoidal manner. When the probe touches an object, the probe vibration becomes distorted, and harmonics appear in the vibration spectrum. It is judged that the probe touches the object at the point where the power of the second harmonic exceeds a threshold level. The performance of the probe is evaluated by measuring the form of a spherical lens die of 4.2mm in diameter. The result of the measurements is examined and the on-machine measurement using the proposed probe is discussed.
机译:提出了一种新颖的振动式测头,用于在超精密机床上加工的小型光学元件的机上测量。所提出的探头的优点是其测量力低,可以小于50μN(5mgf)。探头的最大可测接触角大于60度。因此,该探头适用于测量半球形透镜及其裸片。探针由压电致动器以正弦方式激励。当探针接触物体时,探针的振动会变形,并且在振动谱中会出现谐波。判断探针在二次谐波的功率超过阈值水平的点上触摸物体。通过测量直径为4.2mm的球形透镜模具的形状来评估探头的性能。检查了测量结果,并讨论了使用建议的探头进行的在机测量。

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