Study of interference and damage experiments on electronic equipment in transient and stable EM field

摘要

Electronic equipment is interfered with or damaged from outside in many ways. In all cases the EM field imports some interference through the shelled devices' apertures, however the main interference is introduced through the connecting lines. Some electronic equipment can be interfered with by magnetic pulse without metallic shields. But in the past, people didn't pay enough attention to the influence, even the magnetic pulse by lightning or abrupt actions of the high voltage switch devices. These can cause the parameters to change, performance to decline or the equipment to misoperate, even the equipment to be damaged. The paper gives some experiments to analyze in order to make clear how much the interference can endure.