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intensity in InGaN single quantum well diodes

机译:IngaN单量子阱二极管的强度

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Temperature dependence of electroluminescence (EL) spectral intensity of the super-bright green InGaN single quantum well (SQW) light emitting diodes (LEDs), fabricated by Nichia Chemical Industry Ltd., has been studied over a wide temperature range (T = 15―300K) and as a function of injection current level. It is found that, when T is decreased slightly to 140K, the EL intensity efficiently increases probably due to reduced non-radiative recombination processes and/or increased carrier capture by the localized radiative recombination centers. However, by decreasing T, further, down to 15K, it drastically decreases due to the reduced carrier capture and population, accompanying the disappearance of injection current dependent line shape changes (blue-shift) caused by band filling of the localized recombination centers. These results indicate that the efficient carrier capture by SQW is crucial to enhance the radiative recombination of injected carriers in the presence of the high dislocation density.
机译:在宽温度范围内研究了由Nichia化学工业有限公司制造的超亮绿色IngaN单量子阱(SQW)发光二极管(LED)的电致发光(EL)光学强度的温度依赖性已经在宽温度范围内进行了研究(T = 15- 300k)和作为喷射电流水平的函数。结果发现,当T略微降低至140k时,EL强度可能由于未减少的非辐射重组方法和通过局部辐射重组中心增加的载体捕获而有效地增加。然而,通过减少T,进一步下降至15K,由于载流子捕获和群体的载流量和群体的消失,它由于局部化重组中心引起的喷射电流依赖性线形状变化(蓝移)的消失而大大降低。这些结果表明,通过SQW的有效载体捕获至关重要,以在高位错密度存在下增强注入的载体的辐射重组。

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