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Simulation of debris-induced lift-off in MFL testing

机译:MFL测试中碎屑诱导剥离的仿真

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The results of the testing have shown that debris-induced lift-off, in all its forms, has a detrimental effect on the acquired MFL data. Since there is no reliable and accurate way to determine that lift-off has occurred, it will always be a potential problem. Deeper, wider, and axially aligned slot defects appear to experience the greatest reduction in peak MFL amplitude when under the effect of debris-induced lift-off. This will result in severely underestimated or missed defects. The data indicates that it is very easy for smaller defects to be totally missed. Perhaps the most interesting observation is that a large percentage of the signal degradation occurs in the first 0.125 inch of lift-off. This observation highlights the importance of pre-inspection pipeline cleaning. This essentially indicates that low levels of sensor lift-off and simultaneous sensor and magnetizer lift-off produce significant degradation in the acquired MFL data. If pipeline defects are located in an area where lift-off has occurred, the potential is much higher for them to be missed or underestimated.
机译:测试结果表明,其所有形式的碎屑诱导的剥离对所获得的MFL数据具有不利影响。由于没有可靠且准确的方法来确定发生了升降机,因此它将永远是一个潜在的问题。在碎屑诱导的剥离效果下,更深入,更宽,轴向对齐的槽缺陷似乎体验最大的峰值MFL振幅的减少。这将导致严重低估或错过的缺陷。数据表明,对于完全错过的较小缺陷非常容易。也许最有趣的观察是,在升降0.125英寸的升降中发生大量的信号劣化。该观察结果突出了检查预检测管道清洁的重要性。这基本上表明,低水平的传感器剥离和同时传感器和磁化器升降机在所获取的MFL数据中产生显着的降级。如果管道缺陷位于发生剥离的区域,则它们对于未遗传或低估的潜力要高得多。

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