Cryogenic characterization of ferroelectric materials

摘要

The electronic cryogenic characterization chamber at the New York State College of Ceramics (NYSCC) at Alfred University is capable of measuring impedance, capacitance, and inductance, from room temperature down to /spl sim/15 K. Relative permittivity and loss of 29 compositions produced by Xinetics Inc. were measured to evaluate their dielectric performance at cryogenic temperatures. Capabilities of the cryogenic testing facility at the NYSCC and applications of ferroelectric materials at cryogenic temperatures are discussed.