DATA-BASED CONDITION MONITORING OF AN X-RAY ANALYZER

摘要

Fault diagnosis and condition monitoring can be based on analytical process models, explicit knowledge or direct process measurements. When the structure of the process is unknown, the data-based approach based on the measurements is the most practical one. This is the case also with X-ray fluorescence analyzers. Appropriate analyzer calibration is a key factor in obtaining the best performance from the analysis system. As the mineralogy of the processed material is slowly changing the calibration must be maintained over time. The possible indicators for the calibration validity are studied in this paper.