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Classification of aging level of solid dielectric using Fourier transform infrared spectroscopy — Method of discriminant analysis

机译:傅里叶变换红外光谱法对固体电介质老化水平的分类 - 判别分析方法

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The main objective of this paper is to investigate the possibility of application of Fourier transform infrared spectroscopy and method of discriminant analysis for classification of a solid dielectric. Classification method was determined by applying accelerated thermal aging on glass-mica-based insulating system material. Based on previous experience and on the thermal class of the insulating system, the aging temperature was set to 170 °C. Infrared spectra were measured after 192, 384, and 600 hours of aging using technique of Attenuated Total Reflectance in the middle area of the infrared electromagnetic spectrum (4000–600 cm−1). Regarding the results, it is possible to state that the method of discriminant analysis in connection with Fourier transform infrared spectroscopy can be regarded as a proper diagnostic indicator of aging for material of insulating systems.
机译:本文的主要目的是探讨傅立叶变换红外光谱和判别分析方法的应用,以进行固体电介质的分类。通过在基于玻璃 - 云母基绝缘系统材料上施加加速热老化来确定分类方法。基于以前的经验和绝缘系统的热量等级,衰老温度设定为170℃。在192,384和600小时的老化之后测量红外光谱,使用在红外电磁光谱的中间区域(4000-600cm -1-1)中的衰减的总反射率的技术进行老化。关于结果,可以说明与傅里叶变换红外光谱相关的判别分析方法可以被认为是用于绝缘系统材料的适当诊断指示剂。

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