首页> 外文会议>International Conference on Experience of Designing and Application of CAD Systems in Microelectronics >Investigation of spurious coupling influence on the quality of the microelectronic equipment
【24h】

Investigation of spurious coupling influence on the quality of the microelectronic equipment

机译:对微电子设备质量的杂散耦合影响研究

获取原文

摘要

In this paper were introduced the results of elaboration software-methodical package for spurious coupling account.
机译:本文介绍了用于杂散耦合账户的阐述软件封装的结果。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号