First utilization of energy transfer in structured light projection - Infrared 3D scanner

摘要

In industrial metrology, the system of fringe projection for the fast determination of 3D surface data has been established. The combination of areal and structured projection with two-dimensional optical sensors and triangulation measurement principle allows very high measurement point densities with reasonable accuracy. There are great difficulties with high gloss surfaces and with very dark surfaces for state of the art systems. Transparent materials cannot be measured using the visible spectrum of light. We have therefore developed a new structured light projection system that solves these problems. For the first time the physical principle of energy conversion is utilized in areal structured light projection. We are presenting first results to show the advantages and the capability of this new measurement principle.